Handling abnormal microarray images

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

It is very important to handle abnormal situations during image processing for a high throughput system. The automated quality control, noise analysis, and classification should be incorporated during the system's design. There are many exceptions on the microarray images, which can be classified into 5 major types. Each exception can be caused by different factors. They could have a large impact on the result - either by causing a false signal or failing the experiments. Several examples will be discussed with different handling methods and will be analyzed for each type. Copyright ISCA, CAINE 2014.

Original languageEnglish
Title of host publication27th International Conference on Computer Applications in Industry and Engineering, CAINE 2014
EditorsTakaaki Goto
PublisherInternational Society of Computers and Their Applications (ISCA)
Pages3-7
Number of pages5
ISBN (Electronic)9781880843970
StatePublished - 2014
Event27th International Conference on Computer Applications in Industry and Engineering, CAINE 2014 - New Orleans, United States
Duration: 13 Oct 201415 Oct 2014

Publication series

Name27th International Conference on Computer Applications in Industry and Engineering, CAINE 2014

Conference

Conference27th International Conference on Computer Applications in Industry and Engineering, CAINE 2014
Country/TerritoryUnited States
CityNew Orleans
Period13/10/1415/10/14

Keywords

  • Abnormal
  • Alignment
  • Contact angle
  • Controls
  • Microarray
  • Spot detection

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