Automatic test generation from communicating extended finite state machine (CEFSM)-based models

J. Jenny Li, W. Eric Wong

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

38 Scopus citations

Abstract

We present a methodology based on communicating extended finite state machines (CEFSM) to generate tests automatically from system specifications. Unlike other model-based methods, it does not require the creation of any new models. Rather, it uses the existing available system models including both data and behavioral information. Our CEFSM-based test generation uses FSMs (finite state machines) to model behavior and events, their extension with variables to model data, and their interaction channels to model communication. Our method generates tests based on a combination of behavior, data, and communication specifications. Another important difference is that our method addresses branching coverage not only for data-related decision coverage, but also behavioral transition coverage. Sophisticated "priority" and "dominator" analysis is applied to generate efficient test cases to increase, as much as possible with as few tests as possible, the branching coverage of the system being tested.

Original languageEnglish
Title of host publicationProceedings - 5th IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2002
EditorsSeongsoo Hong, Peter Puschner, Luiz Bacellar
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages181-185
Number of pages5
ISBN (Electronic)0769515584, 9780769515588
DOIs
StatePublished - 2002
Event5th IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2002 - Washington, United States
Duration: 29 Apr 20021 May 2002

Publication series

NameProceedings - 5th IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2002

Conference

Conference5th IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2002
Country/TerritoryUnited States
CityWashington
Period29/04/021/05/02

Keywords

  • Automata
  • Automatic testing

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