A constraint solver for code-based test data generation

J. Jenny Li, W. Eric Wong, Xiao Ma, David Weiss

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

In automatic test generation, after selecting code sequences for testing, they need to be automatically converted into actual executable test cases. One way of test data generation lo cover certain paths is to use a constraint solver. Most existing solvers handle only numerical constraints derived from source code. This paper presents a constraint solver for lest data generation that derives constraints from bytecodes and solves complex constraints involving strings and dynamic objects, We implemented this solver in an automatic test generation tool suite. It handles most of the constraints we have encountered so far, including situations with arrays, Booleans, string types, and objects as parameters of function calls and class attributes.

Original languageEnglish
Title of host publication17th International Conference on Software Engineering and Knowledge Engineering, SEKE 2005
Pages300-305
Number of pages6
StatePublished - 2005
Event17th International Conference on Software Engineering and Knowledge Engineering, SEKE 2005 - Taipei, Taiwan, Province of China
Duration: 14 Jul 200516 Jul 2005

Publication series

Name17th International Conference on Software Engineering and Knowledge Engineering, SEKE 2005

Conference

Conference17th International Conference on Software Engineering and Knowledge Engineering, SEKE 2005
Country/TerritoryTaiwan, Province of China
CityTaipei
Period14/07/0516/07/05

Keywords

  • Code coverage
  • Constraint solver
  • Test generation

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