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Dive into the research topics where Amani Ayad is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Detecting faults vs. Exposing failures: Orthogonal measures of test suite effectiveness
Ayad, A., AlBlwi, S. & Mili, A., Dec 2025, In: Journal of Systems and Software. 230, 112450.Research output: Contribution to journal › Article › peer-review
Open Access -
Subsumption, correctness and relative correctness: Implications for software testing
AlBlwi, S., Marsit, I., Khaireddine, B., Ayad, A., Loh, J. M. & Mili, A., Jan 2025, In: Science of Computer Programming. 239, 103177.Research output: Contribution to journal › Article › peer-review
2 Scopus citations -
Detecting Faults vs. Revealing Failures: Exploring the Missing Link
Ayad, A., Alblwi, S. & Mili, A., 2024, Proceedings - 2024 IEEE 24th International Conference on Software Quality, Reliability and Security, QRS 2024. Institute of Electrical and Electronics Engineers Inc., p. 115-126 12 p. (IEEE International Conference on Software Quality, Reliability and Security, QRS).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
2 Scopus citations -
Mutation Coverage is not Strongly Correlated with Mutation Coverage
Alblwi, S., Ayad, A. & Mili, A., 10 Jun 2024, Proceedings - 2024 IEEE/ACM International Conference on Automation of Software Test, AST 2024. Association for Computing Machinery, Inc, p. 1-11 11 p. (Proceedings - 2024 IEEE/ACM International Conference on Automation of Software Test, AST 2024).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
Open Access3 Scopus citations -
Three Forms of Mutant Subsumption: Basic, Strict and Broad
AlBlwi, S., Marsit, I., Khaireddine, B., Ayad, A., Loh, J. M. & Mili, A., 2023, Software Technologies - 17th International Conference, ICSOFT 2022, Revised Selected Papers. Fill, H.-G., van Sinderen, M., Maciaszek, L. A. & Maciaszek, L. A. (eds.). Springer Science and Business Media Deutschland GmbH, p. 122-144 23 p. (Communications in Computer and Information Science; vol. 1859 CCIS).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review